Adjacent Channel Power Ratio (ACPR) and Error Vector Magnitude (%EVM) Measurements
Texas Instruments
Description
This reference design discusses the use of the TSW3085EVM with the TSW3100 pattern generator to test adjacent channel power ratio (ACPR) and error vector magnitude (EVM) measurements of LTE baseband signals. By using the TSW3100 LTE GUI: patterns are loaded into the TSW3085EVM which is comprised of the DAC3482: TRF3705: and LMK04806.
End equipment reference diagrams
Features
Hardware reference design and Demonstration platform for a complete digital to RF transmitterA Process and setup to test performance metrics for modulated signals such as Error vector Magnitude (%EVM) and Adjacent Channel Power Ratio (ACPR) are providedResults are tabulated for external clocking of the DAC and also for using the internal PLL of the DACAn easy to use evaluation platform to make standards compliant measurements
Applications
- Outdoor backhaul unit
- Vector signal transceiver (VST)
- Indoor backhaul
- Wireless communications test
Product categories
- Data converters
