DAC3161 12-Bit; 500-MSPS Digital-to-Analog Converter Evaluation Module
Texas InstrumentsDAC3161 12-Bit; 500-MSPS Digital-to-Analog Converter Evaluation Module
High Performance Frequency Synthesizer System with Integrated VCO
Texas InstrumentsHigh Performance Frequency Synthesizer System with Integrated VCO
Evaluation Board for 42V, 0.5A Wide Vin Step-Down Switching Regulator
Texas InstrumentsEvaluation Board for 42V, 0.5A Wide Vin Step-Down Switching Regulator
Clock Jitter Cleaner With Dual Cascaded PLLs and Integrated 2.2 GHz VCO
Texas InstrumentsClock Jitter Cleaner With Dual Cascaded PLLs and Integrated 2.2 GHz VCO
AMC1305M05 evaluation module for reinforced isolated modulator with ±50-mV input
Texas InstrumentsAMC1305M05 evaluation module for reinforced isolated modulator with ±50-mV input
EVAL-ADF4151EB1Z
Analog Devices Inc.The ADF4151 allows implementation of fractional-N or integer-N phase-locked loop (PLL) frequency synthesizers if used with an external voltage controlled oscillator (VCO), loop filter, and external reference frequency.The ADF4151 is used with external VCO parts and is footprint and software compatible with the ADF4350. The part consists of a low noise digital phase frequency detector (PFD), a precision charge pump, and a programmable reference divider. There is a ?-? based fractional interpolator to allow programmable fractional-N division. The INT, FRAC, and MOD registers define an overall N divider [N = (INT + (FRAC/MOD))]. The RF output phase is programmable for applications that require a particular phase relationship between the output and the reference. The ADF4151 also features cycle slip reduction circuitry, leading to faster lock times without the need for modifications to the loop filter.Control of all the on-chip registers is through a simple 3-wire interface. The device operates with a power supply ranging from 3.0 V to 3.6 V that can be powered down when not in use.The ADF4151 is available in a 5 mm ? 5 mm package.Applications Wireless infrastructure (W-CDMA, TD-SCDMA, WiMax, GSM, PCS, DCS, DECT) Test equipment Wireless LANs, CATV equipment Clock generation
LM2717MT-ADJEV
National SemiconductorLM2717 - DC/DC, Step Down 2, Non-Isolated Outputs Evaluation Board
STEVAL-MKI198V1K
STMicroelectronicsTemperature Sensor Development Tools Temperature probe kit based on STTS751
