Interface Circuits for TIA/EIA-644 (LVDS) (Rev. B)

This design note provides information concerning the designing of TIA/EIA-644 interface circuits. The TIA/EIA-644 standard is discussed including electrical characteristics interconnections line termination and noise immunity. Finally eye patterns are used to measure the effects of signal distortion noise signal attenuation and the resultant intersymbol interference (ISI) in a data transmis