Input Impedance Measurement Using ADC FFT Data

Texas Instruments published 01/11/2011

Description

Texas Instruments has introduced a family of high-speed analog-to-digital converters (ADCs) suited tomeet the demand for high-speed and high-IF sampling systems. To achieve the highest overall system performance an analog front-end circuit with an antialiasing filter must drive the ADC with the highestpossible dynamic range and lowest distortions. One important parameter of the front-end circ

Technical documents

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Texas Instruments
Input Impedance Measurement Using ADC FFT Data

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