Advanced Profiling with XDS560 Trace (Rev. A)

Texas Instruments published 07/28/2010

Description

While many developers consider XDS560 Trace a valuable tool for debugging difficult scenarios it also provides quick and effective profiling techniques. With the capability of Trace to capture timestamps on each sample and the flexibility of Advanced Event Triggering to capture data at the appropriate locations XDS560 Trace provides unique profiling capabilities. This application note focuses on

Texas Instruments
Advanced Profiling with XDS560 Trace (Rev. A)

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