Rotation Detection With the MSP430 Scan Interface (Rev. B)

Texas Instruments

Published Date: 07/28/2017

Description

This application report details the measurement principles for using an LC sensor to detect rotational movement. Based on this measurement principle an example project is presented demonstrating contactless rotational measurement using the Scan Interface (Scan IF) of the MSP430FW42x family of devices. Software as well as hardware for the implementation is explained.

Parts

Part Number Name Companion Part
MSP430FW423 MSP430FW423 Buy Datasheet