Diode-Connected FET Protects Op Amps

Texas Instruments

Published Date: 10/02/2000

Description

Providing input-overload protection for sensitive measurement circuits proves difficult when you must not degrade the circuits? performance in the process. It?s an especially tricky problem when you?re measuring a material?s dielectric properties. In such an application an ultra-low input bias current op amp serves as a current integrator to measure a dielectric?s response to a 100V step.

Parts

Part Number Name Companion Part
OPA111AM OPA111AM Buy Datasheet
OPA111BM OPA111BM Buy Datasheet
OPA111SM OPA111SM Buy Datasheet
OPA111SMQ OPA111SMQ Buy Datasheet
OPA121KM OPA121KM Buy Datasheet
OPA121KP OPA121KP Buy Datasheet
OPA121KU OPA121KU Buy Datasheet
OPA121KU/2K5 OPA121KU/2K5 Buy Datasheet