Cascading Multiple Linking Addressable Scan Port Devices

Texas Instruments

Published Date: 11/05/2002

Description

This application report is intended to illustrate the capability of cascading multiple Texas Instruments (TI) linking addressable scan port (LASP) devices. It explains configuring the secondary test access ports (TAPs) of cascaded LASPs with the help of a single linking shadow protocol and protocol-bypass inputs. Several examples of linking shadow protocol along with timing requirements and scan

Parts

Part Number Name Companion Part
SN74LVT8986PM SN74LVT8986PM Buy Datasheet