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Application Notes

Practical Technique for Minimizing the Number of Measurements in Sensor Signal

Texas Instruments
The output of many modern bridge type sensors contains errors that must be eliminated through calibration. One major source of error is variation of sensor span and offset from device to device and their respective drifts with temperature. These drifts can be non-linear. Another source of error is the nonlinearity of the sensor output with applied stimulus. Signal conditioning electronics can also

Adaptive Frequency Hopping and Other Co-Existence Mechanisms for CC85xx

Texas Instruments
This application report provides operational details of the RF System that are used in the PurePath Wireless family of devices (CC85xx).

AN-1066 Low Cost Boost Converters Using LM3578A (Rev. B)

Texas Instruments
The LM3578A integrated circuit is a switching regulator with all the power control and protection features.It operates over a wide input voltage range. This together with its low-cost makes it a very popular choicefor use in switching regulators. This application report presents several low-cost boost converter circuitsdeveloped using the LM3578A switching regulator. The operation and the

Programmable Yn Clock Phase Shift w/SN74SSQEA32882 DDR3 Register

Texas Instruments
This application report describes how to shift the Yn clock position on TI’s DDR3 register SN74SSQEA32882 (V4.2) by using extended CMR commands. This Yn clock position shift can be used for the analysis of post register margin at the DRAMs. Note that this application report does not apply to SN74SSQE32882 (V3.1).

Thermocouple Measurements with ΔΣ ADCs

Texas Instruments
Thermocouple Measurements with ΔΣ ADCs

Interfacing the TLC32040 Family to the TMS320 Family (Rev. A)

Texas Instruments
INTERFACING THE TLC32040 FAMILY TO THE TMS320 FAMILY APPLICATION REPORT

SERDES Link Commissioning on KeyStone I and II Devices

Texas Instruments
The serializer-deserializer (SerDes) performs serial-to-parallel conversions on data received from a peripheral device and parallel-to-serial conversion on data received from the CPU. This application report explains the SerDes transmit and receive parameters tuning tools and some debug techniques for TI Keystone I and Keystone II devices.

Semiconductor and IC Package Thermal Metrics (Rev. C)

Texas Instruments
Semiconductor and IC Package Thermal Metrics MCU_C2000_SPRA953C_ZHCA543C_JAJA448

Migrating From MSP430F2xx, MSP430G2xx Families to MSP430FR4xx/FR2xx Family (Rev. C)

Texas Instruments
Migrating From the MSP430F2xx and MSP430G2xx Families to the MSP430FR4xx/FR2xx Family /ASPD/MSP430/App_Reports/SLAA649

Calculator for CAN Bit Timing Parameters

Texas Instruments
Controller Area Network (CAN) nodes use user-specified timing parameters to sample the asynchronous bitstream and recover the clock. These parameters are typically based on the frequency of the available reference oscillator. There may be several options available for a given frequency and some of them will allow a looser oscillator tolerance than others. This application report details the creat

LDOs Thermal Performance in Small SMD Packages

Texas Instruments
The application report LDOs Thermal Performance in Small SMD Packages covers common questions regarding linear regulators and thermal metrics. Thisdocument also provides low dropout linear regulators (LDO) thermal performance comparison betweencontinuous load conditions and pulsed load conditions.

Enable Functionality and Adjusting Under Voltage Lockout for TPS57112-Q1 Device

Texas Instruments
Enable Functionality and Adjusting Under Voltage Lockout for TPS57112-Q1 Device /HVAL/MSA/Power/2-App_Reports

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