130377
Part Number : 130377
Cascade MicrotechPM8 manual analytical probe station, base machine with manual probe platen drive
PM8-FA-PCKG
Part Number : PM8-FA-PCKG
Cascade Microtech200 mm manual station package for failure analysis, including: PM8 probe station, probe platen for vacuum and magnetic positioner bases
Summit 12000B-M
Part Number : Summit 12000B-M
Cascade MicrotechProbe station platform, semi-automated with MicroChamber
TC-002-30x
Part Number : TC-002-30x
Cascade MicrotechSummit Non-Thermal Chucks; FemtoGuard triaxial chuck, non-thermal, 200 mm (8 in.)
TC-002-10x
Part Number : TC-002-10x
Cascade MicrotechSummit Non-Thermal Chucks; Coaxial chuck, non-thermal, 200 mm (8 in.)
OPT-EPS-150T-300C
Part Number : OPT-EPS-150T-300C
Cascade MicrotechThermal chuck for EPS150TESLA (ambient to 300C, capable of 3 kV/200C and 2.5 kV/300C)
EPS-ACC-150T-AG-LT
Part Number : EPS-ACC-150T-AG-LT
Cascade MicrotechSIGMA for Agilent B1505A light, application integration including cables, adapters and interface
E3-ST75P
Part Number : E3-ST75P
Cascade MicrotechElite 300 mm wafer probe system, microscope bridge/transport programmable 75 mm (3x3)
TC-001-30x
Part Number : TC-001-30x
Cascade MicrotechElite 300 mm wafer probe system,Non-Thermal Chucks, FemtoGuard triaxial chuck, non-thermal, 300 mm (12)
TC-001-10x
Part Number : TC-001-10x
Cascade MicrotechElite 300 mm wafer probe system,Non-Thermal Chucks, Coaxial chuck, non-thermal, 300 mm (12)
TS-231-02T
Part Number : TS-231-02T
Cascade MicrotechElite 300 mm wafer probe system, Thermal system for Elite300 AP/M, +30C to 300C, ERS AC3 (100/230 VAC 50/60 Hz)
PA300DSP
Part Number : PA300DSP
Cascade Microtech300 mm Semi-automated Double-sided Probe System, Weight, ~ 825 kg (depending on tool configuration
HVP-13
Part Number : HVP-13
Cascade MicrotechHigh-Power Probes, Voltage,1,500 V (Triax) 3,000 V (Coax)
109-531
Part Number : 109-531
Cascade MicrotechWinCal XE, W-band, Right angle, GSG, 100-400 m pitch
