PA200DSP
Part Number : PA200DSP
Cascade Microtech200 mm Semi-automated Double-sided Probe System, Travel range, 200 mm x 200 mm
Multi |Z| Probe
Part Number : Multi |Z| Probe
Cascade MicrotechA new dimension in multiport high-frequency measurement
138-020
Part Number : 138-020
Cascade MicrotechHigh-Performance DC Parametric Probe, Edge Sense, single blade ceramic needle for DCP-HTR probe body
129-246
Part Number : 129-246
Cascade MicrotechWinCal XE, W-band, Dual/Differential, GSSG, GSS, SSG, GS, 100-150 m
129-247
Part Number : 129-247
Cascade MicrotechWinCal XE, W-band, Dual/Differential, GSSG, GSS, SSG, GS, 175-250 m
129-248
Part Number : 129-248
Cascade MicrotechWinCal XE, W-band, General Purpose Thru, GSGSG (300-650 m), GSSG (300-950 m)
|Z| Probe 10 GHz
Part Number : |Z| Probe 10 GHz
Cascade MicrotechHigh-stable HF wafer contact ideal for automated wafer testing; High-Frequency Wafer Probe (GS/SG 10 GHz)
|Z| Probe 20 GHz
Part Number : |Z| Probe 20 GHz
Cascade MicrotechHighest accuracy up to 20 GHz in GS/SG configuration; High-Frequency Wafer Probe (20 GHz)
|Z| Probe 40 GHz
Part Number : |Z| Probe 40 GHz
Cascade MicrotechMaking HF wafer contact as simple as in DC range; High-Frequency Wafer Probe (40 GHz)
|Z| Probe 67 GHz
Part Number : |Z| Probe 67 GHz
Cascade MicrotechMaximum performance up to 67 GHz; High-Frequency Wafer Probe (67 GHz)
